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Applying a Hybrid Model of Neural Network and Decision Tree Classifier for Predicting University Admission
Simon Fong; Yain-Whar Si; Robert P. Biuk-Aghai
2009-12-01
Conference Name2009 7th International Conference on Information, Communications and Signal Processing (ICICS)
Source PublicationICICS 2009 - Conference Proceedings of the 7th International Conference on Information, Communications and Signal Processing
Conference Date8-10 Dec. 2009
Conference PlaceMacau, China
CountryChina
PublisherIEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Abstract

Predicting university admission is a complex decision making process that is more than merely relying on test scores. It is known by researchers that students' backgrounds and other factors correlate to the performance of their tertiary education. This paper proposes a hybrid model of neural network and decision tree classifier that predicts the likelihood of which university a student may enter, by analysing his academic merits, background and the university admission criteria from that of historical records. Our prototype system was tested with live data from sources of Macau secondary school students. In addition to the high prediction accuracy rate, flexibility is an advantage as the system can predict suitable universities that match the students' profiles and the suitable channels through which the students are advised to enter. Our model can be generalized with other attributes and perform faster when compared to using a neural network alone. 

KeywordClassifier Decision-tree Neural Network University Admission Prediction
DOIhttps://doi.org/10.1109/ICICS.2009.5397665
URLView the original
Language英语
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Document TypeConference paper
CollectionDEPARTMENT OF COMPUTER AND INFORMATION SCIENCE
AffiliationFaculty of Science and Technology University of Macau Macau SAR
First Author AffilicationFaculty of Science and Technology
Recommended Citation
GB/T 7714
Simon Fong,Yain-Whar Si,Robert P. Biuk-Aghai. Applying a Hybrid Model of Neural Network and Decision Tree Classifier for Predicting University Admission[C]:IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA,2009.
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