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Bat Algorithm for Topology Optimization in Microelectronic Applications
Xin-She Yan2; Mehmet Karamanoglu2; Simon Fong1
2012-12-01
Conference NameThe First International Conference on Future Generation Communication Technologies
Source Publication1st International Conference on Future Generation Communication Technologies, FGCT 2012
Pages150-155
Conference Date12-14 Dec. 2012
Conference PlaceLondon, UK
PublisherIEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Abstract

In many design applications, designers often have to find the best geometrical configurations so as to achieve certain objectives with the minimum amount of materials used. Such shape or topology optimization problems are usually much harder to solve than nonlinear optimization problems in a fixed domain. In this paper, we use the recently developed bat algorithm to solve topology optimization problems. Results show that the distribution of different topological characteristics such as materials can be achieved efficiently. We have also tested the bat algorithm by solving nonlinear design benchmarks. Results suggest that bat algorithm is very efficient for solving nonlinear global optimization problems as well as topology optimization. 

KeywordBat Algorithm Inverse Problem Metaheuristics Optimization Algorithm Topology Optimization
DOIhttps://doi.org/10.1109/FGCT.2012.6476566
URLView the original
Indexed BySCI
Language英语
WOS Research AreaComputer Science ; Engineering ; Telecommunications
WOS SubjectComputer Science, Information Systems ; Engineering, Electrical & Electronic ; Telecommunications
WOS IDWOS:000317289400028
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Cited Times [WOS]:15   [WOS Record]     [Related Records in WOS]
Document TypeConference paper
CollectionDEPARTMENT OF COMPUTER AND INFORMATION SCIENCE
Affiliation1.Department of Computer and Information Science Faculty of Science and Technology University of Macau Taipa, Macau
2.School of Science and Technology Middlesex University Hendon Campus London NW4 4BT, UK
Recommended Citation
GB/T 7714
Xin-She Yan,Mehmet Karamanoglu,Simon Fong. Bat Algorithm for Topology Optimization in Microelectronic Applications[C]:IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA,2012:150-155.
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