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Wide stopband band-notched UWB BPF and its application to determination of material dielectric constant
Wang H.2; Tam K.-W.1; Ho S.-K.1; Wu W.2
2013
Conference NameIEEE International Workshop on Electromagnetics (iWEM) - Applications and Student Innovation Competition
Source PublicationIEEE iWEM 2013 - 2013 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition
Pages104-107
Conference DateAUG 01-03, 2013
Conference PlaceHong Kong
CountryChina
Author of SourceIEEE; City Univ Hong Kong, State Key Lab Millimeter Waves; IEEE HK Sect AP MTT; APS
Publication Place345 E 47TH ST, NEW YORK, NY 10017 USA
PublisherIEEE
Abstract

An ultra-wideband (UWB) bandpass filter (BPF) with notched band and wide stopband has been designed, fabricated, and discussed in this work. The proposed UWB BPF is constructed on the basis of microstrip/slotline transitions, which can be used as the feeding structure to provide strong coupling for wideband BPF. The fabricated BPF has good in-band performance with a notched band centered at 8.0 GHz with 8.5% 10-dB fractional bandwidth and the wide stopband with 20-dB attenuation extends to 40 GHz. In addition, a transmission zero, i.e., the notched band can be used for determination of dielectric properties. The effective permittivity of some common materials namely FR-4 or glasses are computed with better than 10% relative error. © 2013 IEEE.

DOI10.1109/iWEM.2013.6888783
URLView the original
Language英语
WOS Research AreaEngineering ; Physics
WOS SubjectEngineering, Electrical & Electronic ; Physics, Applied
WOS IDWOS:000346656600041
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Citation statistics
Document TypeConference paper
CollectionDEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Affiliation1.Universidade de Macau
2.Nanjing University of Science and Technology
Recommended Citation
GB/T 7714
Wang H.,Tam K.-W.,Ho S.-K.,et al. Wide stopband band-notched UWB BPF and its application to determination of material dielectric constant[C]//IEEE; City Univ Hong Kong, State Key Lab Millimeter Waves; IEEE HK Sect AP MTT; APS. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2013:104-107.
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