UM
A fractal-based BEMD method for image texture analysis
JianJia Pan; Dan Zhang; YuanYan Tang
2010-12-01
Conference Name2010 IEEE International Conference on Systems, Man and Cybernetics
Source PublicationConference Proceedings - IEEE International Conference on Systems, Man and Cybernetics
Pages3817-3820
Conference Date10-13 Oct. 2010
Conference PlaceIstanbul, Turkey
PublisherIEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Abstract

This paper presents a new method for texture analysis through Bidimensional Empirical Mode Decomposition (BEMD). Although there have been many filter based methods for texture analysis, problems of non-adaptively and redundancy are still hard to solve. The BEMD is a locally adaptive method and suitable for the analysis of nonlinear or nonstationary signals. The texture image can be decomposed to several IMFs (intrinsic mode functions) by BEMD, which present new characters of the images. But for the BEMD, the boundary interference is a main limit for its application. In this paper, we proposed a new BEMD method based on the self-similar extend method and the neighbor local extremes to reduce the boundary interference. This new method can get a lower orthogonality index (01) of the IMF, which present more clearly features of the texture images. The experiment result shown the new method also reduced the computation complex compared to other surface interpolation based methods. 

KeywordBemd Self-similar Texture Analysis
DOIhttps://doi.org/10.1109/ICSMC.2010.5642020
URLView the original
Indexed BySCI
Language英语
WOS Research AreaComputer Science
WOS SubjectComputer Science, Artificial Intelligence ; Computer Science, Cybernetics ; Computer Science, Information Systems
WOS IDWOS:000295015304006
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Cited Times [WOS]:0   [WOS Record]     [Related Records in WOS]
Document TypeConference paper
CollectionUniversity of Macau
AffiliationDepartment of Computer Science Hong Kong Baptist University Kowloon Toon, Hong Kong
Recommended Citation
GB/T 7714
JianJia Pan,Dan Zhang,YuanYan Tang. A fractal-based BEMD method for image texture analysis[C]:IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA,2010:3817-3820.
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