Missing-Code-occurrence probability calibration technique for DAC nonlinearity with supply and reference circuit analysis in a SAR ADC

doi:10.1109/TCSI.2018.2858848

	Missing-Code-occurrence probability calibration technique for DAC nonlinearity with supply and reference circuit analysis in a SAR ADC
	Wang G.1; Li C.1; Zhu Y.1; Zhong J.1; Lu Y.1; Chan C.-H.1; Martins R.P.1
	2018-11-01
Source Publication	IEEE Transactions on Circuits and Systems I: Regular Papers
ISSN	15498328
Volume	65 Issue:11 Pages:3707-3719
Abstract	This paper reports a calibration scheme that can be used to correct the inter-stage gain error in two-stage analog-to-digital converters (ADCs). We measure the static nonlinearity at the raw ADC outputs and compensate it through a feedback path to adjust the gain in the analog domain, which avoids the dynamic range loss in the conventional pure digital calibrations. The proposed scheme detects the error via the missing-code-occurrence probability (MCOP), which is insensitive to the comparator offset and has better immunity to its noise. Besides the gain error, we discuss other DAC linearity issues, such as the implementations of the reference buffer and the low-dropout (LDO) regulator. To verify the MCOP calibration, we design a 12-bit successive-approximation-register ADC, employing the bridge-DAC, in 65-nm CMOS. We integrate the ADC operating at 100 MS/s with the MCOP calibration, the reference buffers, and the LDO. The measurement results demonstrate the linearity enhancement after the proposed calibration, where we improve the signal-to-noise-and-distortion ratio to 61.38 dB, leading to a FoM of 16.7 fJ/conversion step at the Nyquist input frequency.
Keyword	bridge DAC Gain error calibration low-dropout (LDO) regulator SAR ADC testing signal generation
DOI	10.1109/TCSI.2018.2858848
URL	View the original
Language	英語
Fulltext Access	View Full-Text via DOI View Full-Text via Scopus
Citation statistics
Document Type	Journal article
Collection	University of Macau
Affiliation	1.Universidade de Macau 2.Instituto Superior Técnico
Recommended Citation GB/T 7714	Wang G.,Li C.,Zhu Y.,et al. Missing-Code-occurrence probability calibration technique for DAC nonlinearity with supply and reference circuit analysis in a SAR ADC[J]. IEEE Transactions on Circuits and Systems I: Regular Papers,2018,65(11):3707-3719.
APA	Wang G..,Li C..,Zhu Y..,Zhong J..,Lu Y..,...&Martins R.P..(2018).Missing-Code-occurrence probability calibration technique for DAC nonlinearity with supply and reference circuit analysis in a SAR ADC.IEEE Transactions on Circuits and Systems I: Regular Papers,65(11),3707-3719.
MLA	Wang G.,et al."Missing-Code-occurrence probability calibration technique for DAC nonlinearity with supply and reference circuit analysis in a SAR ADC".IEEE Transactions on Circuits and Systems I: Regular Papers 65.11(2018):3707-3719.

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