On-chip small capacitor mismatches measurement technique using beta-multiplier-biased ring oscillator
Sin S.-W.1; Wei H.-G.1; Chio U.-F.1; Zhu Y.1; Seng-Pan U.1; Martins R.P.1,2; Maloberti F.1,3
2009-12-01
Conference NameIEEE Asian Solid-State Circuits Conference (A-SSCC)
Source PublicationProceedings of Technical Papers - 2009 IEEE Asian Solid-State Circuits Conference, A-SSCC 2009
Pages49-52
Conference DateNOV 16-18, 2009
Conference PlaceTaipei, TAIWAN
Abstract

An on-chip capacitor mismatches measurement technique is proposed. The use of a betamultiplier-biased ring oscillator improves the measurement sensitivity by over 6 times with respect to the state-of-the art. Experimental results using a 90 nm CMOS and thick-oxide transistors are presented. The method enables the measurement of capacitors with mismatches being as small as σ=0.04% only, and the minimum measurable capacitance can be as small 4.3fF. The results also demonstrated that better matching can be achieved with low-density capacitors. ©2009 IEEE.

KeywordBeta Multiplier And Constant Gm Capacitor Mismatches Measurement Ring Oscillator
DOIhttp://doi.org/10.1109/ASSCC.2009.5357165
URLView the original
Indexed BySCI
Language英语
WOS Research AreaEngineering
WOS SubjectEngineering, Electrical & Electronic
WOS IDWOS:000298194200013
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Cited Times [WOS]:6   [WOS Record]     [Related Records in WOS]
Document TypeConference paper
CollectionDEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Faculty of Science and Technology
INSTITUTE OF MICROELECTRONICS
Affiliation1.Analog and Mixed Signal VLSI Laboratory, Faculty of Science and Technology, University of Macau, Macao, China
2.On leave from Instituto Superior Técnico/TU of Lisbon, Portugal
3.University of Pavia, Italy
First Author AffilicationFaculty of Science and Technology
Recommended Citation
GB/T 7714
Sin S.-W.,Wei H.-G.,Chio U.-F.,et al. On-chip small capacitor mismatches measurement technique using beta-multiplier-biased ring oscillator[C],2009:49-52.
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