UM  > 微電子研究院
A Fully Integrated Digital LDO With Coarse-Fine-Tuning and Burst-Mode Operation
Huang M.1; Lu Y.1; Sin S.-W.2; Seng-Pan U.2; Martins R.P.2,3
2016-07-01
Source PublicationIEEE Transactions on Circuits and Systems II: Express Briefs
ISSN15497747
Volume63Issue:7Pages:683-687
Abstract

The digital low dropout regulator (D-LDO) has drawn significant attention recently for its low-voltage operation and process scalability. However, the tradeoff between current efficiency and transient response speed has limited its applications. In this brief, a coarse-fine-tuning technique with burst-mode operation is proposed to the D-LDO. Once the voltage undershoot/overshoot is detected, the coarse tuning quickly finds out the coarse control word in which the load current should be located, with large power MOS strength and high sampling frequency for a fixed time. Then, the fine-tuning, with reduced power MOS strength and sampling frequency, regulates the D-LDO to the desired output voltage and takes over the steady-state operation for high accuracy and current efficiency. The proposed D-LDO is verified in a 65-nm CMOS process with a 0.01-mm active area. The measured voltage undershoot and overshoot are 55 and 47 mV, respectively, with load steps of 2 to 100 mA with a 20-ns edge time. The quiescent current is 82 μA, with a 0.43-ps figure of merit achieved. Moreover, the reference tracking speed is 1.5 V/μs.

KeywordBurst Mode Coarse-fine-tuning (Cft) Digital Control Dynamic Voltage Scaling (Dvs) Energy-efficient Digital Fast Transient Low Dropout Regulator (Ldo)
DOI10.1109/TCSII.2016.2530094
URLView the original
Indexed BySCI
Language英语
WOS Research AreaEngineering
WOS SubjectEngineering, Electrical & Electronic
WOS IDWOS:000380028400015
Fulltext Access
Citation statistics
Cited Times [WOS]:44   [WOS Record]     [Related Records in WOS]
Document TypeJournal article
CollectionINSTITUTE OF MICROELECTRONICS
DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Corresponding AuthorHuang M.; Lu Y.
Affiliation1.State Key Laboratory of Analog and MixedSignal VLSI, University of Macau, Macau, China
2.State Key Laboratory of Analog and MixedSignal VLSI, Faculty of Science and Technology-Department of Electrical and Computer Engineering (FST-ECE), University of Macau, Macau, China
3.Instituto Superior Técnico, Universidade de Lisboa
First Author AffilicationUniversity of Macau
Corresponding Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Huang M.,Lu Y.,Sin S.-W.,et al. A Fully Integrated Digital LDO With Coarse-Fine-Tuning and Burst-Mode Operation[J]. IEEE Transactions on Circuits and Systems II: Express Briefs,2016,63(7):683-687.
APA Huang M.,Lu Y.,Sin S.-W.,Seng-Pan U.,&Martins R.P..(2016).A Fully Integrated Digital LDO With Coarse-Fine-Tuning and Burst-Mode Operation.IEEE Transactions on Circuits and Systems II: Express Briefs,63(7),683-687.
MLA Huang M.,et al."A Fully Integrated Digital LDO With Coarse-Fine-Tuning and Burst-Mode Operation".IEEE Transactions on Circuits and Systems II: Express Briefs 63.7(2016):683-687.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Huang M.]'s Articles
[Lu Y.]'s Articles
[Sin S.-W.]'s Articles
Baidu academic
Similar articles in Baidu academic
[Huang M.]'s Articles
[Lu Y.]'s Articles
[Sin S.-W.]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Huang M.]'s Articles
[Lu Y.]'s Articles
[Sin S.-W.]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.